Abstract
We consider an inverse problem which arises in the framework of identification of doping profiles for semiconductor devices, based on current measures for varying voltage. We set formally the inverse
problem, and study and discuss the main properties of the resulting problem.
Anno
2006
Autori IAC
Tipo pubblicazione
Altri Autori
Al G.; Torcicollo I.; Vessella S.
Editore
de Gruyter
Rivista
Journal of inverse and ill-posed problems (Print)
